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dc.contributor.advisor Amer, Hassanein Hamed
dc.contributor.author Alkady, Gehad Ismail Ibrahim
dc.date.accessioned 2015-06-11T07:27:32Z
dc.date.available 2017-06-10T22:00:14Z
dc.date.created 2015 Summer en_US
dc.date.issued 2015-06-11
dc.identifier.uri http://dar.aucegypt.edu/handle/10526/4454
dc.description.abstract One of the devices that play a great role in electronic circuits design, specifically safety-critical design applications, is Field programmable Gate Arrays (FPGAs). This is because of its high performance, re-configurability and low development cost. FPGAs are used in many applications such as data processing, networks, automotive, space and industrial applications. Negative impacts on the reliability of such applications result from moving to smaller feature sizes in the latest FPGA architectures. This increases the need for fault-tolerant techniques to improve reliability and extend system lifetime of FPGA-based applications. In this thesis, two fault-tolerant techniques for FPGA-based applications are proposed with a built-in fault detection region. A low cost fault detection scheme is proposed for detecting faults using the fault detection region used in both schemes. The fault detection scheme primarily detects open faults in the programmable interconnect resources in the FPGAs. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can be detected. For fault recovery, each scheme has its own fault recovery approach. The first approach uses a spare module and a 2-to-1 multiplexer to recover from any fault detected. On the other hand, the second approach recovers from any fault detected using the property of Partial Reconfiguration (PR) in the FPGAs. It relies on identifying a Partially Reconfigurable block (P_b) in the FPGA that is used in the recovery process after the first faulty module is identified in the system. This technique uses only one location to recover from faults in any of the FPGA’s modules and the FPGA interconnects. Simulation results show that both techniques can detect and recover from open faults. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can also be detected. Finally, both techniques require low area overhead. en_US
dc.description.sponsorship I would like to acknowledge both my supervisors: Prof. H.H. Amer and Dr. Mohamed Bakr for their great support throughout my thesis. I would also like to acknowledge Dr. Nahla Elaraby and Dr. Ahmed Madien for their assistance throughout my research. I would like to acknowledge my examiners Dr. Ahmed Abou Auf and Dr. Rafik El gendy for their valuable and constructive comments that help me a lot in improving the quality of this thesis. Finally, I would like to acknowledge the graduate program directors: Dr. Ayman El Ezabei and Dr Karim Seddik. en_US
dc.format.extent 122 p. en_US
dc.format.medium theses en_US
dc.language.iso en en_US
dc.rights Author retains all rights with regard to copyright. en
dc.subject FPGA en_US
dc.subject fault-tolerance en_US
dc.subject fault detection en_US
dc.subject dynamic fault recovery en_US
dc.subject interconnect en_US
dc.subject partial reconfiguration. en_US
dc.subject.lcsh Thesis (M.S.)--American University in Cairo en_US
dc.subject.lcsh Field programmable gate arrays.
dc.subject.lcsh Fault tolerance (Engineering)
dc.title Fault-tolerant fpga for mission-critical applications. en_US
dc.type Text en_US
dc.subject.discipline Electronics Engineering en_US
dc.rights.access This item is restricted for 2 years from the date issued en_US
dc.contributor.department American University in Cairo. Dept. of Electronics Engineering en_US
dc.description.irb American University in Cairo Institutional Review Board approval is not necessary for this item, since the research is not concerned with living human beings or bodily tissue samples. en_US
dc.contributor.committeeMember Abou Auf, Ahmed,RafikGuindy


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  • Theses and Dissertations [1731]
    This collection includes theses and dissertations authored by American University in Cairo graduate students.

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